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In-situ characterization and extraction of SRAM variability.

S. Chellappa, J. Ni, X. Yao, N. Hindman, J. Velamala, M. Chen, Y. Cao, and L. Clark. DAC, page 711-716. ACM, (2010)

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Thadigiri Aruna Jyothi Raja

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Self-Tuning for Maximized Lifetime Energy-Efficiency in the Presence of Circuit Aging.E. Mintarno, J. Skaf, R. Zheng, J. Velamala, Y. Cao, S. Boyd, R. Dutton, and S. Mitra. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (5): 760-773 (2011)Optimized self-tuning for circuit aging.E. Mintarno, J. Skaf, R. Zheng, J. Velamala, Y. Cao, S. Boyd, R. Dutton, and S. Mitra. DATE, page 586-591. IEEE Computer Society, (2010)Cross-Layer Modeling and Simulation of Circuit Reliability.Y. Cao, J. Velamala, K. Sutaria, M. Chen, J. Ahlbin, I. Esqueda, M. Bajura, and M. Fritze. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (1): 8-23 (2014)A self-evolving design methodology for power efficient multi-core systems.J. Sun, R. Zheng, J. Velamala, Y. Cao, R. Lysecky, K. Shankar, and J. Roveda. ICCAD, page 264-268. IEEE, (2010)Statistical aging under dynamic voltage scaling: A logarithmic model approach.J. Velamala, K. Sutaria, H. Shimizu, H. Awano, T. Sato, and Y. Cao. CICC, page 1-4. IEEE, (2012)A self-tuning design methodology for power-efficient multi-core systems.J. Sun, R. Zheng, J. Velamala, Y. Cao, R. Lysecky, K. Shankar, and J. Roveda. ACM Trans. Design Autom. Electr. Syst., 18 (1): 4:1-4:24 (2012)Circuit aging prediction for low-power operation.R. Zheng, J. Velamala, V. Reddy, V. Balakrishnan, E. Mintarno, S. Mitra, S. Krishnan, and Y. Cao. CICC, page 427-430. IEEE, (2009)Susceptibility of planar and 3D tri-gate technologies to muon-induced single event upsets.N. Seifert, S. Jahinuzzaman, J. Velamala, and N. Patel. IRPS, page 2. IEEE, (2015)Design sensitivity of single event transients in scaled logic circuits.J. Velamala, R. LiVolsi, M. Torres, and Y. Cao. DAC, page 694-699. ACM, (2011)In-situ characterization and extraction of SRAM variability.S. Chellappa, J. Ni, X. Yao, N. Hindman, J. Velamala, M. Chen, Y. Cao, and L. Clark. DAC, page 711-716. ACM, (2010)

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Disambiguation of "Velamala, Jyothi"

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In-situ characterization and extraction of SRAM variability.

Please choose a person to relate this publication to

Thadigiri Aruna Jyothi Raja

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Velamala, Jyothi"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML In-situ characterization and extraction of SRAM variability.

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Thadigiri Aruna Jyothi Raja

Other publications of authors with the same name

Disambiguation

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In-situ characterization and extraction of SRAM variability.