( en | de | ru )

 

Disambiguation of "Nigh, Phil"

Author of the publication

copydeleteadd this publication to your clipboard
SIA Roadmap: test must not limit future technologies.

. ITC, page 1152. IEEE Computer Society, (1998)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Michael Nightingale

Phil Zundel

Phil Langer

Phil Liebing

Phil Blunsom

 

Other publications of authors with the same name

SIA Roadmap: test must not limit future technologies.. ITC, page 1152. IEEE Computer Society, (1998)Physically-Aware N-Detect Test., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (2): 308-321 (2012)Industry leaders panel - How will testing change in the next 10 years?. ITC, page 1. IEEE Computer Society, (2011)How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?. ITC, page 1-4. IEEE Computer Society, (2012)Board manufacturing test correlation to IC manufacturing test., , , and . ITC, page 1-8. IEEE Computer Society, (2014)Binning for IC Quality: Experimental Studies on the SEMATECH Data., , , and . DFT, page 4-10. IEEE Computer Society, (1998)Redefining ATE: "Data Collection Engines that Drive Yield Learning and Process Optimization".. ITC, page 1429. IEEE Computer Society, (2004)The Evolving Role of Test ... it is now a "Value Add" Operation.. DFT, page 3-3. IEEE Computer Society, (2008)Debating the Future of Burn-In., , , , , and . VTS, page 311-314. IEEE Computer Society, (2002)Built-in current testing-feasibility study., and . ICCAD, page 340-343. IEEE Computer Society, (1988)