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Disambiguation of "Nigh, Phil"

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How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?

. ITC, page 1-4. IEEE Computer Society, (2012)

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Michael Nightingale

Phil Zundel

Phil Langer

Phil Liebing

Phil Blunsom

 

Other publications of authors with the same name

Physically-Aware N-Detect Test., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (2): 308-321 (2012)SIA Roadmap: test must not limit future technologies.. ITC, page 1152. IEEE Computer Society, (1998)Board manufacturing test correlation to IC manufacturing test., , , and . ITC, page 1-8. IEEE Computer Society, (2014)Industry leaders panel - How will testing change in the next 10 years?. ITC, page 1. IEEE Computer Society, (2011)How are failure modes, defect types and test methods changing for 32nm/28nm technologies and beyond?. ITC, page 1-4. IEEE Computer Society, (2012)Binning for IC Quality: Experimental Studies on the SEMATECH Data., , , and . DFT, page 4-10. IEEE Computer Society, (1998)The Evolving Role of Test ... it is now a "Value Add" Operation.. DFT, page 3-3. IEEE Computer Society, (2008)Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment., , , and . ITC, page 43-52. IEEE Computer Society, (1998)So What Is an Optimal Test Mix? A Discussion of the SEMATECH Methods Experiment., , , , , and . ITC, page 1037-1038. IEEE Computer Society, (1997)Failure analysis of timing and IDDq-only failures from the SEMATECH test methods experiment., , , , , , , and . ITC, page 1152-1161. IEEE Computer Society, (1999)