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A Universal Technique for Accelerating Simulation of Scan Test Patterns.

, , and . ITC, page 135-141. IEEE Computer Society, (1996)

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Saturating Counters: Application and Design Alternatives., , and . IEEE Symposium on Computer Arithmetic, page 228-. IEEE Computer Society, (2003)Redundancy Requirements for Embedded Memories., and . ISQED, page 8. IEEE Computer Society, (2001)A Universal Technique for Accelerating Simulation of Scan Test Patterns., , and . ITC, page 135-141. IEEE Computer Society, (1996)Amdahl Corporation Board Delay Test System., , and . ITC, page 558-567. IEEE Computer Society, (1992)