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A Universal Technique for Accelerating Simulation of Scan Test Patterns.

, , и . ITC, стр. 135-141. IEEE Computer Society, (1996)

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Bejoy Saha

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Другие публикации лиц с тем же именем

Amdahl Corporation Board Delay Test System., , и . ITC, стр. 558-567. IEEE Computer Society, (1992)A Universal Technique for Accelerating Simulation of Scan Test Patterns., , и . ITC, стр. 135-141. IEEE Computer Society, (1996)Saturating Counters: Application and Design Alternatives., , и . IEEE Symposium on Computer Arithmetic, стр. 228-. IEEE Computer Society, (2003)Redundancy Requirements for Embedded Memories., и . ISQED, стр. 8. IEEE Computer Society, (2001)