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Disambiguation of "Kang, Sungho"

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A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.

, , , and . VTS, page 152-157. IEEE Computer Society, (2009)

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Sungho Jo

Ewha Kang

Mihyun Kang

Andree Kang

Namhi Kang

 

Other publications of authors with the same name

A New Built-in Self Test Scheme for Phase-Locked Loops Using Internal Digital Signals., , , and . IEICE Trans. Electron., 91-C (10): 1713-1716 (2008)Interleaving Test Algorithm for Subthreshold Leakage-Current Defects in DRAM Considering the Equal Bit Line Stress., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (4): 803-812 (2014)A Delay Test Architecture for TSV With Resistive Open Defects in 3-D Stacked Memories., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (11): 2380-2387 (2014)Broadcast scan compression based on deterministic pattern generation algorithm., , , and . ISQED, page 449-453. IEEE, (2017)Path search engine for fast optimal path search using efficient hardware architecture., , , and . ISOCC, page 96-99. IEEE, (2011)A Novel Massively Parallel Testing Method Using Multi-Root for High Reliability., , and . IEEE Trans. Reliab., 64 (1): 486-496 (2015)A Memory-Efficient Pattern Matching with Hardware-Based Bit-Split String Matchers for Deep Packet Inspection., , , , and . IEICE Trans. Commun., 93-B (2): 396-398 (2010)Enhanced Postbond Test Architecture for Bridge Defects Between the TSVs., , and . IEEE Trans. Very Large Scale Integr. Syst., 29 (6): 1164-1177 (2021)Test-Friendly Data-Selectable Self-Gating (DSSG)., , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (8): 1972-1976 (2019)Reconfigurable Scan Architecture for High Diagnostic Resolution., , and . IEEE Access, (2021)