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High-Voltage and High-Power PLL Diagnostics using Advanced Cooling and Emission Images., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)Time-integrated photon emission as a function of temperature in 32 nm CMOS., , , , , , and . IRPS, page 2. IEEE, (2015)Testing of Ultra Low Voltage VLSI Chips using the Superconducting Single-Photon Detector (SSPD)., and . Microelectron. Reliab., 44 (9-11): 1663-1668 (2004)Innovative packaging technique for backside optical testing of wire-bonded chips., , and . Microelectron. Reliab., 45 (9-11): 1493-1498 (2005)A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current., , , and . ITC, page 140-147. IEEE Computer Society, (2004)Tools for contactless testing and simulation of CMOS circuits., , , and . Microelectron. Reliab., 41 (11): 1801-1808 (2001)A high sensitivity process variation sensor utilizing sub-threshold operation., , , , and . CICC, page 125-128. IEEE, (2008)MARVEL - Malicious alteration recognition and verification by emission of light., , , , , , , and . HOST, page 117-121. IEEE Computer Society, (2011)Innovate Practices on CyberSecurity of Hardware Semiconductor Devices., , , , , , , , , and 4 other author(s). VTS, page 1. IEEE, (2019)Novel IC Sub-Threshold IDDQ Signature And Its Relationship To Aging During High Voltage Stress., , and . ESSDERC, page 250-253. IEEE, (2018)