( en | de | ru )

 

Disambiguation of "McManus, Moyra K."

Author of the publication

copydeleteadd this publication to your clipboard
Latchup Analysis Using Emission Microscopy.

, , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Kevin McManus

Aman K K Bhasin

K Kusterer

K Dugaev

K Pillen

 

Other publications of authors with the same name

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)Latchup Analysis Using Emission Microscopy., , , , , , , , , and . Microelectron. Reliab., 43 (9-11): 1603-1608 (2003)Diagnosis and characterization of timing-related defects by time-dependent light emission., , , , , , , , , and 1 other author(s). ITC, page 733-739. IEEE Computer Society, (1998)Diagnostic techniques for the IBM S/390 600 MHz G5 microprocessor., , , , , , and . ITC, page 1073-1082. IEEE Computer Society, (1999)Non-invasive timing analysis of IBM G6 microprocessor L1 cache using picosecond imaging circuit analysis., , , , and . Asian Test Symposium, page 125-. IEEE Computer Society, (2000)Design for low power and power management in IBM Blue Gene/Q., , , , , , , , , and 1 other author(s). IBM J. Res. Dev., 57 (1/2): 3 (2013)The attack of the "Holey Shmoos": a case study of advanced DFD and picosecond imaging circuit analysis (PICA)., , , , , , , , , and . ITC, page 883-891. IEEE Computer Society, (1999)Optical diagnosis of excess IDDQ in low power CMOS circuits., , , , and . Microelectron. Reliab., 42 (9-11): 1689-1694 (2002)Optical and Electrical Testing of Latchup in I/O Interface Circuits., , , , , , , and . ITC, page 236-245. IEEE Computer Society, (2003)