Author of the publication

A 44-mm2 four-bank eight-word page-read 64-Mb flash memory with flexible block redundancy and fast accurate word-line voltage controller.

, , , , , , , , , , , , , and . IEEE J. Solid State Circuits, 37 (11): 1485-1492 (2002)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A 44-mm2 four-bank eight-word page-read 64-Mb flash memory with flexible block redundancy and fast accurate word-line voltage controller., , , , , , , , , and 4 other author(s). IEEE J. Solid State Circuits, 37 (11): 1485-1492 (2002)Optimization of word-line booster circuits for low-voltage flash memories., and . IEEE J. Solid State Circuits, 34 (8): 1091-1098 (1999)A Circuit Analysis of Pre-Emphasis Pulses for RC Delay Lines., and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 104-A (6): 912-926 (2021)On-chip switched-capacitor DC-DC converter in memory technology: State of the art and challenges.. ECCTD, page 1-4. IEEE, (2017)A process- and temperature-tolerant power-on reset circuit with a flexible detection level higher than the bandgap voltage.. ISCAS, page 2302-2305. IEEE, (2008)Circuit techniques for a 1.8-V-only NAND flash memory., , , and . IEEE J. Solid State Circuits, 37 (1): 84-89 (2002)A Charge Loss Aware Advanced Model of Dickson Voltage Multipliers., , , and . IEEE Access, (2022)An Analytical Model of Charge Pump DC-DC Voltage Multiplier Using Diodes.. IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 100-A (5): 1137-1144 (2017)A Pre-Emphasis Pulse Generator Insensitive to Process Variation for Driving Large Memory and Panel Display Arrays with Minimal Delay Time., and . APCCAS, page 45-48. IEEE, (2019)A 172mm2 32Gb MLC NAND flash memory in 34nm CMOS., , , , , , , , , and 24 other author(s). ISSCC, page 236-237. IEEE, (2009)