( en | de | ru )

 

Disambiguation of "Sumikawa, Nik"

Author of the publication

copydeleteadd this publication to your clipboard
Discovering Interesting Plots in Production Yield Data Analytics.

, , , and . CoRR, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Nik Mohamed Nik-Abdullah

Nik Looker

Bogumila Poga nik

Radek Lopu ník

Bojan Pe nik

 

Other publications of authors with the same name

Multivariate outlier modeling for capturing customer returns - How simple it can be., , , and . IOLTS, page 164-169. IEEE, (2014)Discovering Interesting Plots in Production Yield Data Analytics., , , and . CoRR, (2018)Functional test content optimization for peak-power validation - An experimental study., , , and . ITC, page 1-10. IEEE Computer Society, (2012)Primitive Concept Identification In A Given Set Of Wafer Maps., , , and . VLSI-DAT, page 1-4. IEEE, (2019)Forward prediction based on wafer sort data - A case study., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Wafer Pattern Recognition Using Tucker Decomposition., , , and . VTS, page 1-6. IEEE, (2019)Deploying A Machine Learning Solution As A Surrogate., , , and . ITC, page 1-10. IEEE, (2019)An experiment of burn-in time reduction based on parametric test analysis., , and . ITC, page 1-10. IEEE Computer Society, (2012)Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits., , , , and . DATE, page 794-799. IEEE, (2011)Novel test detection to improve simulation efficiency - A commercial experiment., , , , , and . ICCAD, page 101-108. ACM, (2012)