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VeriCDF: a new verification methodology for charged device failures.

, , and . DAC, page 874-879. ACM, (2002)

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Fast temperature calculation for transient electrothermal simulation by mixed frequency/time domain thermal model reduction., and . DAC, page 750-755. ACM, (2000)Parametric yield optimization of CMOS analogue circuits by quadratic statistical circuit performance models., , , and . I. J. Circuit Theory and Applications, 19 (6): 579-592 (1991)Fast settling frequency synthesizer with two-point channel control paths., and . I. J. Circuit Theory and Applications, 40 (10): 1071-1083 (2012)Macrocell placement with temperature profile optimization., and . ISCAS (6), page 390-393. IEEE, (1999)Temperature-driven power and timing analysis for CMOS ULSI circuits., and . ISCAS (6), page 214-217. IEEE, (1999)New current-mode sense amplifiers for high density DRAM and PIM architectures., , , , and . ISCAS (4), page 938-941. IEEE, (2001)Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology., , , and . ISCAS (4), page 746-749. IEEE, (2001)Functional Verification of ECL Circuits Including Voltage Regulators., and . ISCAS, page 1710-1713. IEEE, (1993)1-GS/s, 12-bit SiGe BiCMOS D/A converter for high-speed DDFs., , , and . ISCAS (1), page 901-904. IEEE, (2003)High Performance CMOS Macromodule Layout Synthesis., , and . ISCAS, page 179-182. IEEE, (1994)