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SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology.

, , , , , and . DFTS, page 177-182. IEEE Computer Society, (2015)

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Influence of triple-well technology on laser fault injection and laser sensor efficiency., , , , , , and . DFTS, page 85-90. IEEE Computer Society, (2015)Fault Model Analysis of Laser-Induced Faults in SRAM Memory Cells., , , and . FDTC, page 89-98. IEEE Computer Society, (2013)Protecting Secure ICs Against Side-Channel Attacks by Identifying and Quantifying Potential EM and Leakage Hotspots at Simulation Stage., , , and . COSADE, volume 12910 of Lecture Notes in Computer Science, page 129-147. Springer, (2021)Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation., , , , , , and . IRPS, page 1. IEEE, (2015)Experimental validation of a Bulk Built-In Current Sensor for detecting laser-induced currents., , , , , and . IOLTS, page 150-155. IEEE, (2015)Checking Robustness Against EM Side-Channel Attacks Prior to Manufacturing., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (5): 1264-1275 (2022)Laser-induced fault effects in security-dedicated circuits., , , , , , , , , and 9 other author(s). VLSI-SoC, page 1-6. IEEE, (2014)Laser attacks on integrated circuits: From CMOS to FD-SOI., , , , , , , , , and . DTIS, page 1-6. IEEE, (2014)SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology., , , , , and . DFTS, page 177-182. IEEE Computer Society, (2015)Robustness improvement of an SRAM cell against laser-induced fault injection., , , , , , and . DFTS, page 149-154. IEEE Computer Society, (2013)