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Non-invasive testing of VLSI circuits.

. Polytechnic University of Milan, Italy, (2005)

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Ugo Tosi

Alessandro Tosi

Milena Józefina Tosiek

Delia Tosi

Niccolò Tosi

 

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Innovative packaging technique for backside optical testing of wire-bonded chips., , и . Microelectron. Reliab., 45 (9-11): 1493-1498 (2005)Implementation of TRE systems into Emission Microscopes., , , , и . Microelectron. Reliab., 44 (9-11): 1529-1534 (2004)Time-Resolved Diffuse Reflectance Using Small Source-Detector Separation and Fast Single-Photon Gating, , , , , , , , , и 1 other автор(ы). (2008)Large-Area, Fast-Gated Digital SiPM With Integrated TDC for Portable and Wearable Time-Domain NIRS., , , , , , , , , и 2 other автор(ы). IEEE J. Solid State Circuits, 55 (11): 3097-3111 (2020)0.16 µm-BCD Silicon Photomultipliers with Sharp Timing Response and Reduced Correlated Noise., , , , и . Sensors, 18 (11): 3763 (2018)A Compact Multi-Distance DCS and Time Domain NIRS Hybrid System for Hemodynamic and Metabolic Measurements., , , , , , и . Sensors, 21 (3): 870 (2021)Non-invasive testing of VLSI circuits.. Polytechnic University of Milan, Italy, (2005)Monolithic single-photon detectors and time-to-digital converters for picoseconds time-of-flight ranging., , , и . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, том 7875 из SPIE Proceedings, стр. 78750P. SPIE, (2011)Emission Engineering in Germanium Nanoresonators, , , , , , , , , и 8 other автор(ы). ACS Photonics, 2 (1): 53-59 (21.01.2015)Linear arrays of single-photon detectors for photon counting and timing., , , , , и . Sensors, Cameras, and Systems for Industrial, Scientific, and Consumer Applications, том 7875 из SPIE Proceedings, стр. 78750N. SPIE, (2011)