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Disambiguation of "Hatayama, Kazumi"

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Estimation of delay test quality and its application to test generation.

, , , , , , and . ICCAD, page 413-417. IEEE Computer Society, (2007)

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Kazumi Seki

 

Other publications of authors with the same name

An Adaptive Test for Parametric Faults Based on Statistical Timing Information., , , , , , , and . Asian Test Symposium, page 151-156. IEEE Computer Society, (2009)Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion., , , , , , , , , and 4 other author(s). ITC, page 47-55. IEEE, (2023)Accelerated Test Points Selection Method for Scan-Based BIST., , and . Asian Test Symposium, page 359-. IEEE Computer Society, (1997)High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST., , , , , , , , , and 3 other author(s). ATS, page 37-42. IEEE, (2022)Effective IR-drop reduction in at-speed scan testing using Distribution-Controlling X-Identification., , , , , , , , and . ICCAD, page 52-58. IEEE Computer Society, (2008)Estimation of delay test quality and its application to test generation., , , , , , and . ICCAD, page 413-417. IEEE Computer Society, (2007)Enhanced Delay Test Generator for High-Speed Logic LSIs., , , , , and . ITC, page 161-165. IEEE Computer Society, (1989)Session Abstract.. VTS, page 200-201. IEEE Computer Society, (2006)Innovative Test Practices in Asia., , , , , , , , , and 3 other author(s). VTS, page 1. IEEE, (2020)Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing., , , , , , , , , and 3 other author(s). IEICE Electron. Express, 20 (1): 20220470 (2023)