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Compact Hierarchical Bipolar Transistor Modeling With HiCUM

, and . International Series on Advances in Solid State Electronics and Technology World Scientific, (2010)

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Compact Hierarchical Bipolar Transistor Modeling With HiCUM, and . International Series on Advances in Solid State Electronics and Technology World Scientific, (2010)Thermal Crosstalk Analysis in RRAM Passive Crossbar Arrays., , and . CoRR, (2023)Collector-substrate modeling of SiGe HBTs up to THz range., , , , , and . BCICTS, page 1-4. IEEE, (2019)Random telegraph noise in SiGe HBTs: Reliability analysis close to SOA limit., , , , , , and . Microelectron. Reliab., (2017)Modeling Dynamic Lateral Current Crowding in SiGe HBTs., , and . BCICTS, page 224-227. IEEE, (2022)Cross-coupled Self-Heating and Consequent Reliability Issues in GaN-Si Hetero-integration: Thermal Keep-Out-Zone Quantified., , , , , , and . IRPS, page 1-6. IEEE, (2023)Comprehensive study of random telegraph noise in base and collector of advanced SiGe HBT: Bias, geometry and trap locations., , , , , , and . ESSDERC, page 260-263. IEEE, (2016)Physics based Compact Model for Drain Current in Fin-Shaped GaN MIS-HEMTs., , , , and . BCICTS, page 1-4. IEEE, (2021)Thermal Crosstalk Analysis in ReRAM Passive Crossbar Arrays., , and . VLSID, page 390-395. IEEE, (2024)Reliability of high-speed SiGe: C HBT under electrical stress close to the SOA limit., , , , , , , and . Microelectron. Reliab., 55 (9-10): 1433-1437 (2015)