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Disambiguation of "Tehranipoor, Mark"

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Harnessing Nanoscale Device Properties for Hardware Security.

, , , and . MTV, page 42-47. IEEE Computer Society, (2015)

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Mark Yampolsky

Maßnahmen zur Sicherung von E2E-QoS bei verketteten Diensten. Uni München, (2009)

Mark Schütte

Crf2 - ein neues Antigen von Aspergillus fumigatus. TU Braunschweig, (2009)

Mark Yampolskiy

Maßnahmen zur Sicherung von E2E-QoS bei verketteten Diensten. Uni München, (2009)

Ana Markovi

Experimental and theoretical analysis of the mass transport through porous glass membranes with different pore diameters. Uni Magdeburg, (2009)

Mark Aufenanger

 

Other publications of authors with the same name

Analyzing Security Vulnerabilities Induced by High-level Synthesis., , , , and . ACM J. Emerg. Technol. Comput. Syst., 18 (3): 47:1-47:22 (2022)Hardware Trust and Assurance through Reverse Engineering: A Survey and Outlook from Image Analysis and Machine Learning Perspectives., , , , , , , , , and . CoRR, (2020)Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor., , , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (1): 109-121 (2015)TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (5): 855-868 (2017)Rock'n'roll PUFs: Crafting Provably Secure PUFs from Less Secure Ones., , , , , and . PROOFS, volume 11 of Kalpa Publications in Computing, page 33-48. EasyChair, (2019)RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the RTL for Security Applications., , , and . ITC, page 165-174. IEEE, (2022)POCA: First Power-on Chip Authentication in Untrusted Foundry and Assembly., , , , , , and . HOST, page 124-135. IEEE, (2021)BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning., , , , , and . ITC, page 1-10. IEEE, (2016)Invited: End-to-End Secure SoC Lifecycle Management., , , , , and . DAC, page 1295-1298. IEEE, (2021)Device attestation: Past, present, and future., , , and . DATE, page 473-478. IEEE, (2018)