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Towards the Integration of Reliability and Security Mechanisms to Enhance the Fault Resilience of Neural Networks., , , , and . IEEE Access, (2021)Automating the Generation of Programs Maximizing the Sustained Switching Activity in Microprocessor units via Evolutionary Techniques., , and . Microprocess. Microsystems, (April 2023)Functional Testing with STLs: A Step Towards Reliable RISC-V-based HPC Commodity Clusters., , , , and . ISC Workshops, volume 13999 of Lecture Notes in Computer Science, page 444-457. Springer, (2023)Maximizing the Switching Activity of Different Modules Within a Processor Core via Evolutionary Techniques., , and . DSD, page 535-540. IEEE, (2021)Using Formal Methods to Support the Development of STLs for GPUs., , , , , and . ATS, page 84-89. IEEE, (2022)Automatic Identification of Functionally Untestable Cell-Aware Faults in Microprocessors., , , , , and . ATS, page 1-6. IEEE, (2023)Automating the Generation of Programs Maximizing the Repeatable Constant Switching Activity in Microprocessor Units via MaxSAT., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (11): 4270-4281 (November 2023)Effective SAT-based Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity in a Pipelined Processor., , , , , and . ATS, page 73-78. IEEE, (2021)Automating the Generation of Functional Stress Inducing Stimuli for Burn-In Testing., , , , , and . ETS, page 1-5. IEEE, (2023)Improving the Fault Resilience of Neural Network Applications Through Security Mechanisms., , , , and . DSN (Supplements), page 23-24. IEEE, (2022)