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New topic session 7B: Challenges and directions for ultra-low voltage VLSI circuits and systems: CMOS and beyond.

, , и . VTS, стр. 1. IEEE Computer Society, (2013)

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Monika Kaminska

Bozena Kilarski

Bozena Kilarski

Bozena Kilarski

Bozena Scheuble

 

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Testing Real-Time Properties of Embedded Systems., и . ESA, стр. 179-185. CSREA Press, (2008)Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits., , и . EDAC-ETC-EUROASIC, стр. 658. IEEE Computer Society, (1994)Initiability: A Measure of Sequential Testability., , и . ISCAS, стр. 1619-1622. IEEE, (1993)Comparative analysis of cis-regulation following stroke and seizures in subspaces of conserved eigensystems., , , , и . BMC Syst. Biol., (2010)Multifrequency Analysis of Faults in Analog Circuits., и . IEEE Des. Test Comput., 12 (2): 70-80 (1995)Design for testability of embedded integrated operational amplifiers., и . IEEE J. Solid State Circuits, 33 (4): 573-581 (1998)Multiple Fault Testing in Analog Circuits., и . VLSI Design, стр. 61-66. IEEE Computer Society, (1994)Parametric Fault Simulation and Test Vector Generation., , и . DATE, стр. 650-656. IEEE Computer Society / ACM, (2000)Will 0.1um Digital Circuits Require Mixed-Signal Testing., , , , и . VTS, стр. 186-187. IEEE Computer Society, (1997)2D and 3D integration with organic and silicon electronics., , , , и . DATE, стр. 899-904. IEEE, (2011)