Author of the publication

Two dimensional analytical modeling for asymmetric 3T and 4T double gate tunnel FET in sub-threshold region: Potential and electric field.

, , and . Microelectron. J., 44 (12): 1251-1259 (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Impact of Dummy Poly on the Process-Induced Mechanical Stress Enhanced Circuit Performance., , and . VDAT, volume 7373 of Lecture Notes in Computer Science, page 357-359. Springer, (2012)An efficient method for ECSM characterization of CMOS inverter in nanometer range technologies., , , and . ISQED, page 665-669. IEEE, (2013)Phase Noise Analysis of Separately Driven Ring Oscillators., , , , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 69 (11): 4415-4428 (2022)A Variation Aware Jitter Estimation Methodology in ROs Considering Over/Undershoots in NTV Regime., , and . IEEE Trans. Circuits Syst. II Express Briefs, 69 (3): 1557-1561 (2022)Design and Realization of High-Speed Low-Noise Multi-Loop Skew-Based ROs Optimized for Even/Odd Multi-Phase Signals., , , , , and . IEEE Trans. Circuits Syst., 67-II (11): 2352-2356 (2020)Impact of Random Spatial Fluctuation in Non-Uniform Crystalline Phases on Multidomain MFIM Capacitor and Negative Capacitance FDSOI., , , , , , , , , and 1 other author(s). IRPS, page 23-1. IEEE, (2022)Investigation of Body Bias Impact in Si/SiGe Heterojunction Line TFETs: A Physical Insight., and . ISCAS, page 1-5. IEEE, (2023)Design optimization Using Symmetric/Asymmetric Spacer for 14 nm Multi-Fin Tri-gate Fin-FET for Mid-Band 5G Applications., , , , , , and . VLSID, page 292-296. IEEE, (2022)Tutorial T6: FinFET Device Circuit Co-design: Issues and Challenges., and . VLSID, page 12-13. IEEE Computer Society, (2015)A unified Verilog-A compact model for lateral Si nanowire (NW) FET incorporating parasitics for circuit simulation., , , , , and . VDAT, page 1-6. IEEE, (2016)