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Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.

Y. Sun, C. Zhan, J. Guo, Y. Fu, G. Li, and J. Xia. IRPS, page 3. IEEE, (2015)

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Yongsheng Tan

Yongsheng Zhang

Other publications of authors with the same name

Unstructured Semantic Model supported Deep Neural Network for Click-Through Rate Prediction.C. Niu, G. Zhong, Y. Liu, Y. Zhang, Y. Sun, A. He, and Z. Chen. CoRR, (2018)mu-Average n-Widths on the Wiener Space.Y. Sun, and C. Wang. J. Complex., 10 (4): 428-436 (1994)Chaotic Vibration and Comfort Analysis of Nonlinear Half-Vehicle Mode Excited by Consecutive Speed-Control Humps.Z. Yang, S. Liang, Q. Zhu, Y. Sun, and S. Zhan. J. Robotics Mechatronics, 27 (5): 513-519 (2015)MSEC: Multi-Scale Erasure and Confusion for fine-grained image classification.Y. Zhang, Y. Sun, N. Wang, Z. Gao, F. Chen, C. Wang, and J. Tang. Neurocomputing, (2021)Research on Path Delay with BTI Recovery Effect.J. Wu, Y. Sun, Y. Wang, Y. Lin, M. Fan, and J. Huang. ETS, page 1-4. IEEE, (2022)Placement mitigation techniques for power grid electromigration.W. Ye, Y. Lin, X. Xu, W. Li, Y. Fu, Y. Sun, C. Zhan, and D. Pan. ISLPED, page 1-6. IEEE, (2017)New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology.P. Ren, C. Liu, S. Wan, J. Zhang, Z. Yu, N. Liu, Y. Sun, R. Wang, C. Zhan, Z. Gan and 3 other author(s). IRPS, page 3-1. IEEE, (2018)Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.Y. Sun, C. Zhan, J. Guo, Y. Fu, G. Li, and J. Xia. IRPS, page 3. IEEE, (2015)Kolmogorov widths between the anisotropic space and the space of functions with mixed smoothness.H. Wang, and Y. Sun. J. Approx. Theory, 126 (1): 52-59 (2004)Average Error Bounds of Best Approximation of Continuous Functions on the Wiener Space.Y. Sun, and C. Wang. J. Complex., 11 (1): 74-104 (1995)

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Disambiguation of "Sun, Yongsheng"

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Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.

Please choose a person to relate this publication to

Yongsheng Tan

Yongsheng Zhang

Yongsheng Zhang

Yongsheng Zhang

Yongsheng Zhang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Sun, Yongsheng"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.

Please choose a person to relate this publication to

Yongsheng Tan

Yongsheng Zhang

Yongsheng Zhang

Yongsheng Zhang

Yongsheng Zhang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies.