From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

No persons found for author name Zorian, Yervant
add a person with the name Zorian, Yervant
 

Другие публикации лиц с тем же именем

Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs., , , , и . ITC, стр. 1-6. IEEE, (2018)Memory FIT Rate Mitigation Technique for Automotive SoCs., , , , , , , и . ITC, стр. 1-6. IEEE, (2019)Count-based BIST compaction schemes and aliasing probability computation., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (6): 768-777 (1992)Effective march algorithms for testing single-order addressed memories., и . J. Electron. Test., 5 (4): 337-345 (1994)Minimal March Tests for Detection of Dynamic Faults in Random Access Memories., , и . J. Electron. Test., 23 (1): 55-74 (2007)International Test Conference in Asia (ITC-Asia) - Bridging ITC and Test Community in Asia., , , , и . ITC, стр. 1-4. IEEE, (2019)Guest Editors' Introduction: Design & Test of a High-Volume 3-D Stacked Graphics Processor With High-Bandwidth Memory., и . IEEE Des. Test, 34 (1): 6-7 (2017)A D&T Roundtable: Testing Mixed Logic and DRAM Chips., , , , , , , и . IEEE Des. Test Comput., 15 (2): 86-92 (1998)Guest Editors' Introduction: East Meets West., и . IEEE Des. Test Comput., 13 (1): 5-7 (1996)Guest Editor's Introduction: Advances in Infrastructure IP.. IEEE Des. Test Comput., 20 (3): 49- (2003)