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Impact of Resistive-Bridging Defects in SRAM Core-Cell.

R. Fonseca, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, and N. Badereddine. DELTA, page 265-269. IEEE Computer Society, (2010)

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Elena Sergeyev

Nikolai Sergeev

Tatiana Sergey

Dieter Sergel

Jean-Frédéric Sergejew

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A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction.N. Badereddine, Z. Wang, P. Girard, K. Chakrabarty, A. Virazel, S. Pravossoudovitch, and C. Landrault. J. Electron. Test., 24 (4): 353-364 (2008)Random Adjacent Sequences: An Efficient Solution for Logic BIST.R. David, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. VLSI-SOC, volume 218 of IFIP Conference Proceedings, page 413-424. Kluwer, (2001)Parity prediction synthesis for nano-electronic gate designs.D. Tran, A. Virazel, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, and H. Wunderlich. ITC, page 820. IEEE Computer Society, (2010)Circuit Partitioning for Low Power BIST Design with Minimized Peak Power Consumption.P. Girard, L. Guiller, C. Landrault, and S. Pravossoudovitch. Asian Test Symposium, page 89-94. IEEE Computer Society, (1999)A new test pattern generation method for delay fault testing.S. Cremoux, C. Fagot, P. Girard, C. Landrault, and S. Pravossoudovitch. VTS, page 296-301. IEEE Computer Society, (1996)Failure Analysis and Test Solutions for Low-Power SRAMs.L. Zordan, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Todri, A. Virazel, and N. Badereddine. Asian Test Symposium, page 459-460. IEEE Computer Society, (2011)Resistive-open defect injection in SRAM core-cell: analysis and comparison between 0.13 µm and 90 nm technologies.L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, and M. Bastian. DAC, page 857-862. ACM, (2005)Comprehensive bridging fault diagnosis based on the SLAT paradigm.Y. Benabboud, A. Bosio, L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, L. Bouzaida, and I. Izaute. DDECS, page 264-269. IEEE Computer Society, (2009)Defect Analysis for Delay-Fault BIST in FPGAs.P. Girard, O. Héron, S. Pravossoudovitch, and M. Renovell. IOLTS, page 124-128. IEEE Computer Society, (2003)On Using Efficient Test Sequences for BIST.R. David, P. Girard, C. Landrault, S. Pravossoudovitch, and A. Virazel. VTS, page 145-152. IEEE Computer Society, (2002)

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Disambiguation of "Pravossoudovitch, Serge"

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Impact of Resistive-Bridging Defects in SRAM Core-Cell.

Please choose a person to relate this publication to

Elena Sergeyev

Nikolai Sergeev

Tatiana Sergey

Dieter Sergel

Jean-Frédéric Sergejew

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Pravossoudovitch, Serge"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Impact of Resistive-Bridging Defects in SRAM Core-Cell.

Please choose a person to relate this publication to

Elena Sergeyev

Nikolai Sergeev

Tatiana Sergey

Dieter Sergel

Jean-Frédéric Sergejew

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Impact of Resistive-Bridging Defects in SRAM Core-Cell.