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Efficiently using data splitting and retransmission to tolerate faults in networks-on-chip interconnects., , , и . ISCAS, стр. 4101-4104. IEEE, (2010)Increasing reliability of programmable mixed-signal systems by applying design diversity redundancy., , , и . European Test Symposium, стр. 261. IEEE Computer Society, (2010)Test and Design-for-Test of Mixed-Signal Integrated Circuits., и . IFIP Congress Tutorials, том 157 из IFIP, стр. 183-212. Kluwer/Springer, (2004)Guest Editorial., , и . J. Electron. Test., 23 (6): 469 (2007)Searching for Global Test Costs Optimization in Core-Based Systems., , , и . J. Electron. Test., 20 (4): 357-373 (2004)A New FPGA for DSP Applications Integrating BIST Capabilities., , , и . J. Electron. Test., 20 (4): 423-431 (2004)Selected Papers from the International Mixed Signals Testing and GHz/Gbps Test Workshop., , и . VLSI Design, (2008)A new adaptive analog test and diagnosis system., , , и . IEEE Trans. Instrum. Meas., 49 (2): 223-227 (2000)Designing Testable Networks for Transfer Function Realization., , , и . LATW, стр. 84-87. IEEE, (2001)Filter Sensitivity Analysis Using the TRAM., , , и . LATW, стр. 80-83. IEEE, (2001)