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A new approach to build a low-level malicious fault list starting from high-level description and alternative graphs.

, , , , and . ED&TC, page 560-565. IEEE Computer Society, (1997)

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The Use of Model Checking in ATPG for Sequential Circuits., , , and . CAV, volume 531 of Lecture Notes in Computer Science, page 86-95. Springer, (1990)An experimental analysis of the effectiveness of the circular self-test path technique., , and . EURO-DAC, page 246-251. IEEE Computer Society, (1994)A Self-Repairing Execution Unit for Microprogrammed Processors., , and . IEEE Micro, 21 (5): 16-22 (2001)DTIS 2015 foreword., and . DTIS, page 1. IEEE, (2015)On-line Testing of an Off-the-shelf Microprocessor Board for Safety-critical Applications., , , , , , and . EDCC, volume 1150 of Lecture Notes in Computer Science, page 190-202. Springer, (1996)Scan chain encryption for the test, diagnosis and debug of secure circuits., , , , , and . ETS, page 1-6. IEEE, (2017)Designing and Testing High Dependable Memories for Aerospace Applications., , , , and . VLSI-SOC, page 221-. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)Design and Review of Water Management System Using Ethernet, Wi-Fi 802.11n, Modbus, and Other Communication Standards., , , , and . Wireless Personal Communications, 106 (4): 1677-1699 (2019)Online and Offline BIST in IP-Core Design., , , , and . IEEE Des. Test Comput., 18 (5): 92-99 (2001)Guest Editorial., and . J. Electron. Test., 17 (3-4): 207 (2001)