( en | de | ru )

 

Disambiguation of "Taouil, Mottaqiallah"

Author of the publication

copydeleteadd this publication to your clipboard
Methodology for Application-Dependent Degradation Analysis of Memory Timing.

, , , , , , and . DATE, page 162-167. IEEE, (2019)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Mottaqiallah Taouil

 

Other publications of authors with the same name

Software-Based Mitigation for Memory Address Decoder Aging., , , , , , and . LATS, page 1-6. IEEE, (2019)Hardware-Based Aging Mitigation Scheme for Memory Address Decoder., , , , , , and . ETS, page 1-6. IEEE, (2019)Reliability Modeling and Mitigation for Embedded Memories., , and . ITC, page 1-10. IEEE, (2019)Mitigation of Sense Amplifier Degradation Using Skewed Design., , , , , and . DATE, page 1614-1617. IEEE, (2020)Using Hopfield Networks to Correct Instruction Faults., , , and . ATS, page 102-107. IEEE, (2022)Device-Aware Test for Ion Depletion Defects in RRAMs., , , , , and . ITC, page 246-255. IEEE, (2023)Survey on Architectural Attacks: A Unified Classification and Attack Model., , , , and . ACM Comput. Surv., 56 (2): 42:1-42:32 (February 2024)Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM., , , , , and . DATE, page 1717-1722. IEEE, (2021)Reliability Analysis of FinFET-Based SRAM PUFs for 16nm, 14nm, and 7nm Technology Nodes., , , , , and . DATE, page 1189-1192. IEEE, (2022)Revealing the Secrets of Spiking Neural Networks: The Case of Izhikevich Neuron., , , , , and . DSD, page 514-518. IEEE, (2021)