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Bias Temperature Instability analysis of FinFET based SRAM cells., , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Energy Optimization for Large-Scale 3D Manycores in the Dark-Silicon Era., , , , and . IEEE Access, (2019)Alternative Architectures Toward Reliable Memristive Crossbar Memories., , , and . IEEE Trans. Very Large Scale Integr. Syst., 24 (1): 206-217 (2016)Guest Editorial Memristive-Device-Based Computing., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (12): 2581-2583 (2018)Testing Resistive Memories: Where are We and What is Missing?, , and . ITC, page 1-9. IEEE, (2018)DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs., , , , and . ETS, page 1-2. IEEE, (2019)ETS 2016 foreword., , , , and . ETS, page 1. IEEE, (2016)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)Reliability challenges of real-time systems in forthcoming technology nodes., , , , , and . DATE, page 129-134. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Public-Key Based Authentication Architecture for IoT Devices Using PUF., , , and . CoRR, (2020)