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A New Language Approach for IJTAG., , , , , и . ITC, стр. 1-10. IEEE Computer Society, (2008)Limit surface and moment function descriptions of planar sliding., , и . ICRA, стр. 794-799. IEEE Computer Society, (1989)An improved test process model for cost reduction., и . Bell Labs Tech. J., 11 (1): 173-190 (2006)Energy scavenging for energy efficiency in networks and applications., , , и . Bell Labs Tech. J., 15 (2): 7-29 (2010)Scan chain securization though Open-Circuit Deadlocks., , и . ITC, стр. 808. IEEE Computer Society, (2010)Parameter Estimation for a Model with Both Imperfect Test and Repair., , , , , , и . VTS, стр. 271-276. IEEE Computer Society, (2007)Scalable and efficient integrated test architecture., , и . ITC, стр. 1. IEEE Computer Society, (2009)On optimal partially integrated production and marketing policy with variable demand under flexibility and reliability considerations via Genetic Algorithm., , и . Appl. Math. Comput., 188 (1): 525-537 (2007)An inventory model with Weibull demand rate, finite rate of production and shortages., , и . Int. J. Syst. Sci., 37 (14): 1003-1009 (2006)Optimal replenishment and credit policy in EOQ model under two-levels of trade credit policy when demand is influenced by credit period., , , и . Int. J. Syst. Assur. Eng. Manag., 3 (4): 352-359 (2012)