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Disambiguation of "Wu, Wen Ching"

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Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits.

, , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (11): 2097-2101 (2008)

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Wu Wen

Wen Wu

Ching-Wen Hsueh

Wen-Ching Fann

Ching-chang Wu

 

Other publications of authors with the same name

A Built-in Self-Diagnosis and Repair Design With Fail Pattern Identification for Memories., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2184-2194 (2011)Distributed Fault Simulation for Sequential Circuits by Pattern Partitioning., , , and . EDAC-ETC-EUROASIC, page 661. IEEE Computer Society, (1994)MRAM Defect Analysis and Fault Modeli., , , , , , and . ITC, page 124-133. IEEE Computer Society, (2004)A Parallel Built-in Diagnostic Scheme for Multiple Embedded Memories., , , , and . MTDT, page 65-69. IEEE Computer Society, (2004)A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 15 (7): 767-776 (2007)Impact of Capacitance Correlation on Yield Enhancement of Mixed-Signal/Analog Integrated Circuits., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (11): 2097-2101 (2008)Diagnosis for MRAM write disturbance fault., , , , , , and . ITC, page 1-9. IEEE Computer Society, (2007)Fault diagnosis of odd-even sorting networks., , , and . Asian Test Symposium, page 288-. IEEE Computer Society, (1997)CAD reference flow for 3D via-last integrated circuits., , , , and . ASP-DAC, page 187-192. IEEE, (2010)A Probabilistic Testability Measure for Delay Faults., and . DAC, page 440-445. ACM, (1991)