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Disambiguation of "Poehls, Letícia Maria Bolzani"

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Analyzing the behavior of FinFET SRAMs with resistive defects.

, , , and . VLSI-SoC, page 1-6. IEEE, (2017)

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María Leticia Solari

Werner Bolzani

Karl Poehls

Axel Poehls

Ana Letícia Souza Vanz

 

Other publications of authors with the same name

Selected Peer-Reviewed Articles from the 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013., and . J. Low Power Electron., 10 (1): 163-164 (2014)Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs., , , , and . VLSID, page 405-410. IEEE Computer Society, (2015)Hierarchical identification of NBTI-critical gates in nanoscale logic., , , , , , and . LATW, page 1-6. IEEE, (2014)Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI., , , , , , , , and . EMC Compo, page 89-94. IEEE, (2013)Identifying NBTI-Critical Paths in Nanoscale Logic., , , , , and . DSD, page 136-141. IEEE Computer Society, (2013)Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs., , , and . VLSI-SoC (Selected Papers), volume 500 of IFIP Advances in Information and Communication Technology, page 22-45. Springer, (2017)Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects., , , , , and . J. Electron. Test., 37 (3): 383-394 (2021)Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs., , , , , and . LATS, page 1-6. IEEE, (2022)Analyzing the behavior of FinFET SRAMs with resistive defects., , , and . VLSI-SoC, page 1-6. IEEE, (2017)Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach., , , , , , , , and . J. Electron. Test., 28 (6): 777-789 (2012)