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A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment.

, , , , и . J. Electron. Test., 37 (5): 675-684 (2021)

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Takashi Iwata

Koichiro Iwata

Tatsuya Nakada

Tatsuya Hagino

Tatsuya Banno

 

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