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An Integrated Validation Environment for Differential Power Analysis.

, , and . DELTA, page 527-532. IEEE Computer Society, (2008)

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On Preventing SAT Attack with Decoy Key-Inputs., , , and . ISVLSI, page 114-119. IEEE, (2021)Analyzing testability from behavioral to RT level., , and . ED&TC, page 158-165. IEEE Computer Society, (1997)High-level synthesis for easy testability., , and . ED&TC, page 198-206. IEEE Computer Society, (1995)Scan chain encryption for the test, diagnosis and debug of secure circuits., , , , , and . ETS, page 1-6. IEEE, (2017)Laser attacks on integrated circuits: From CMOS to FD-SOI., , , , , , , , , and . DTIS, page 1-6. IEEE, (2014)Compression-based SoC Test Infrastructures., , and . VLSI-SoC (Selected Papers), volume 291 of IFIP, page 1-15. Springer, (2007)A novel hardware logic encryption technique for thwarting illegal overproduction and Hardware Trojans., , , , and . IOLTS, page 49-54. IEEE, (2014)New testing procedure for finding insertion sites of stealthy hardware trojans., , , , and . DATE, page 776-781. ACM, (2015)Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model., , , , , , , , , and 3 other author(s). FDTC, page 1-6. IEEE Computer Society, (2018)A secure scan design methodology., , , and . DATE, page 1177-1178. European Design and Automation Association, Leuven, Belgium, (2006)