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Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification.

R. Zhan, H. Feng, Q. Wu, X. Guan, G. Chen, H. Xie, and A. Wang. ASP-DAC, page 710-712. IEEE Computer Society, (2004)

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Yühe Feng

Feng Yan

Feng Shi

Feng Qiu

Zhaoyong Feng

Other publications of authors with the same name

A Charge Pump with Perfect Current Matching Applied to Phase-Locked Loop in 65nm CMOS.J. Zu, X. Xing, and H. Feng. ASICON, page 1-4. IEEE, (2021)A 20Mbps 5.8mw QPSK transmitter based on injection locking and Class-E PA for wireless biomedical applications.Y. Lei, X. Xing, H. Feng, and Z. Wang. ASICON, page 448-451. IEEE, (2017)Analysis and design of a 0.9 V 1 GHz-BW 14.6 dBm-OIP3 broadband receiver with current-mode analog baseband in 12 nm FinFET CMOS.G. Wang, Q. Xiao, H. Feng, J. Hu, J. Dong, and J. Yang. Microelectron. J., (2024)A 4 to 5GHz Digitally Controlled Ring Oscillator with 100kHz Resolution using Noise Cancellation Technology in 40nm CMOS.S. Fang, J. Hu, H. Feng, X. Xing, H. Wang, and L. Yang. ICTA, page 110-111. IEEE, (2022)An ESD protection circuit for mixed-signal ICs.H. Feng, K. Gong, and A. Wang. CICC, page 493-496. IEEE, (2001)A 14-bit 6GS/s DAC Achieving >65dBc SFDR with Bilateral Output Impedance Compensation in 22nm CMOS.X. Xing, Q. Huang, T. Chen, H. Feng, and Z. Wang. ISCAS, page 1-5. IEEE, (2024)L-simulator: a magPEEC-based new CAD tool for simulating magnetic-enhanced IC inductors of 3D arbitrary geometry.H. Long, Z. Feng, H. Feng, A. Wang, and T. Ren. ISCAS (5), page 233-237. IEEE, (2004)ESDInspector: a new layout-level ESD protection circuitry design verification tool using a smart-parametric checking mechanism.R. Zhan, H. Feng, H. Xie, and A. Wang. ISCAS (5), page 217-220. IEEE, (2004)A Low Frequency Drift LC-DCO with Wide Temperature Range.J. Hu, S. Fang, H. Feng, X. Xing, H. Wang, and L. Yang. ICTA, page 121-122. IEEE, (2022)An 8-b 8-GS/s Time-Interleaved SAR ADC With Foreground Offset Calibration in 28nm CMOS.Z. Yang, X. Xing, X. Zheng, H. Feng, H. Fu, and G. Gielen. APCCAS, page 181-184. IEEE, (2022)

BibSonomy

Disambiguation of "Feng, Haigang"

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Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification.

Please choose a person to relate this publication to

Yühe Feng

Feng Yan

Feng Shi

Feng Qiu

Zhaoyong Feng

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Feng, Haigang"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification.

Please choose a person to relate this publication to

Yühe Feng

Feng Yan

Feng Shi

Feng Qiu

Zhaoyong Feng

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Concept and extraction method of ESD-critical parameters for function-based layout-level ESD protection circuit design verification.