Author of the publication

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

, , , , , , , and . Microelectron. Reliab., 43 (9-11): 1663-1668 (2003)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

IR confocal laser microscopy for MEMS Technological Evaluation., , , , and . Microelectron. Reliab., 42 (9-11): 1815-1817 (2002)Fault Localization using Time Resolved Photon Emission and STIL Waveforms., , , , , and . ITC, page 254-263. IEEE Computer Society, (2003)Backside Hot Spot Detection Using Liquid Crystal Microscopy., , , , , , , and . Microelectron. Reliab., 42 (9-11): 1741-1746 (2002)NIR laser stimulation for dynamic timing analysis., , , , , , and . Microelectron. Reliab., 45 (9-11): 1459-1464 (2005)From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing., , , , , , and . Microelectron. Reliab., 43 (9-11): 1681-1686 (2003)Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation., , , , , , and . Microelectron. Reliab., 41 (9-10): 1539-1544 (2001)Solar Cell Analysis with Light Emission and OBIC Techniques., , , , , and . Microelectron. Reliab., 43 (9-11): 1755-1760 (2003)Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices., , , , , and . Microelectron. Reliab., 42 (9-11): 1581-1585 (2002)Short defect characterization based on TCR parameter extraction., , , , , , , and . Microelectron. Reliab., 43 (9-11): 1563-1568 (2003)A New Versatile Testing Interface for Failure Analysis in Integrated Circuits., , and . Microelectron. Reliab., 41 (9-10): 1495-1499 (2001)