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A novel scheme to reduce power supply noise for high-quality at-speed scan testing.

X. Wen, K. Miyase, S. Kajihara, T. Suzuki, Y. Yamato, P. Girard, Y. Ohsumi, and L. Wang. ITC, page 1-10. IEEE Computer Society, (2007)

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Andy Ch Laungani

Harn-Jing Terng

Terng-Yaw Lin

Wang Wang

Linfang Wang

Investigation of the functions of 53BP1 in DNA demethylationL. Wang. Uni Marburg, (2009)

Other publications of authors with the same name

A Novel ATPG Method for Capture Power Reduction during Scan Testing.X. Wen, S. Kajihara, K. Miyase, T. Suzuki, K. Saluja, L. Wang, and K. Kinoshita. IEICE Trans. Inf. Syst., 90-D (9): 1398-1405 (2007)Turbo1500: Core-Based Design for Test and Diagnosis.L. Wang, R. Apte, S. Wu, B. Sheu, W. Jone, J. Guo, K. Lee, W. Wang, X. Wen, H. Chao and 5 other author(s). IEEE Des. Test Comput., 26 (1): 26-35 (2009)Scan Flip-Flop Grouping to Compress Test Data and Compact Test Responses for Launch-on-Capture Delay Testing.D. Xiang, Z. Chen, and L. Wang. ACM Trans. Design Autom. Electr. Syst., 17 (2): 18:1-18:24 (2012)Self-Testing of Embedded RAMs.Z. Sun, and L. Wang. ITC, page 148-156. IEEE Computer Society, (1984)Low-capture-power test generation for scan-based at-speed testing.X. Wen, Y. Yamashita, S. Morishima, S. Kajihara, L. Wang, K. Saluja, and K. Kinoshita. ITC, page 10. IEEE Computer Society, (2005)CTX: A Clock-Gating-Based Test Relaxation and X-Filling Scheme for Reducing Yield Loss Risk in At-Speed Scan Testing.H. Furukawa, X. Wen, K. Miyase, Y. Yamato, S. Kajihara, P. Girard, L. Wang, and M. Tehranipoor. ATS, page 397-402. IEEE Computer Society, (2008)At-Speed Logic BIST for IP Cores.B. Cheon, E. Lee, L. Wang, X. Wen, P. Hsu, J. Cho, J. Park, H. Chao, and S. Wu. DATE, page 860-861. IEEE Computer Society, (2005)Condensed Linear Feedback Shift Register (LFSR) Testing - A Pseudoexhaustive Test Technique.L. Wang, and E. McCluskey. IEEE Trans. Computers, 35 (4): 367-370 (1986)GPU-based timing-aware test generation for small delay defects.K. Liao, P. Chen, A. Lin, J. Li, M. Hsiao, and L. Wang. ETS, page 1-2. IEEE, (2014)LCTI-SS: Low-Clock-Tree-Impact Scan Segmentation for Avoiding Shift Timing Failures in Scan Testing.Y. Yamato, K. Miyase, S. Kajihara, X. Wen, L. Wang, and M. Kochte. IEEE Des. Test, 30 (4): 60-70 (2013)

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Disambiguation of "Wang, Laung-Terng"

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A novel scheme to reduce power supply noise for high-quality at-speed scan testing.

Please choose a person to relate this publication to

Andy Ch Laungani

Harn-Jing Terng

Terng-Yaw Lin

Wang Wang

Linfang Wang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wang, Laung-Terng"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A novel scheme to reduce power supply noise for high-quality at-speed scan testing.

Please choose a person to relate this publication to

Andy Ch Laungani

Harn-Jing Terng

Terng-Yaw Lin

Wang Wang

Linfang Wang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A novel scheme to reduce power supply noise for high-quality at-speed scan testing.