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Testing Real-Time Properties of Embedded Systems., and . ESA, page 179-185. CSREA Press, (2008)Estimation of Simultaneous Switching Power and Ground Noise of Static CMOS Combinational Circuits., , and . EDAC-ETC-EUROASIC, page 658. IEEE Computer Society, (1994)Initiability: A Measure of Sequential Testability., , and . ISCAS, page 1619-1622. IEEE, (1993)Comparative analysis of cis-regulation following stroke and seizures in subspaces of conserved eigensystems., , , , and . BMC Syst. Biol., (2010)Multifrequency Analysis of Faults in Analog Circuits., and . IEEE Des. Test Comput., 12 (2): 70-80 (1995)Design for testability of embedded integrated operational amplifiers., and . IEEE J. Solid State Circuits, 33 (4): 573-581 (1998)Parametric Fault Simulation and Test Vector Generation., , and . DATE, page 650-656. IEEE Computer Society / ACM, (2000)Multiple Fault Testing in Analog Circuits., and . VLSI Design, page 61-66. IEEE Computer Society, (1994)2D and 3D integration with organic and silicon electronics., , , , and . DATE, page 899-904. IEEE, (2011)Will 0.1um Digital Circuits Require Mixed-Signal Testing., , , , and . VTS, page 186-187. IEEE Computer Society, (1997)