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Functional test for shifting-type FIFOs., , and . ED&TC, page 133-138. IEEE Computer Society, (1995)Towards a Uniform Notation for Memory Tests., , and . ED&TC, page 420-427. IEEE Computer Society, (1996)An Effective BIST Scheme for Ring-Address Type FIFOs., , and . ITC, page 378-387. IEEE Computer Society, (1994)Address and Data Scrambling: Causes and Impact on Memory Tests., and . DELTA, page 128-136. IEEE Computer Society, (2002)Consequences of RAM Bitline Twisting for Test Coverage., and . DATE, page 11176-11177. IEEE Computer Society, (2003)Fault models and tests for Ring Address Type FIFOs., , and . VTS, page 300-305. IEEE Computer Society, (1994)Functional Tests for Ring-Address SRAM-type FIFOs., , and . EDAC-ETC-EUROASIC, page 666. IEEE Computer Society, (1994)Influence of Bit Line Twisting on the Faulty Behavior of DRAMs., , , and . MTDT, page 32-37. IEEE Computer Society, (2004)Semiconductor manufacturing process monitoring using built-in self-test for embedded memories., , , , and . ITC, page 872-881. IEEE Computer Society, (1998)Industrial evaluation of stress combinations for march tests applied to SRAMs., and . ITC, page 983-992. IEEE Computer Society, (1999)