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Fundamental reliability issues of advanced charge-trapping Flash memory devices., and . ICECS, page 1009-1012. IEEE, (2010)Active safety system with RF energy harvesting capabilities for industrial applications using interchangeable implements., , , , and . IECON, page 5286-5292. IEEE, (2014)Wireless sensor systems with energy harvesting capabilities for safety enhancement in agricultural vehicles., and . ICIT, page 1950-1955. IEEE, (2016)Photovoltaic scavenging systems: Modeling and optimization., , , , , and . Microelectron. J., 40 (9): 1337-1344 (2009)Towards a Universal Model of Dielectric Breakdown., , , , , and . IRPS, page 1-8. IEEE, (2023)A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design., , , and . ESSDERC, page 204-207. IEEE, (2017)A 30.5 dBm 48% PAE CMOS Class-E PA With Integrated Balun for RF Applications., , , and . IEEE J. Solid State Circuits, 43 (8): 1755-1762 (2008)Random Telegraph Signal noise properties of HfOx RRAM in high resistive state., , , , and . ESSDERC, page 274-277. IEEE, (2012)Balanced CMOS LC-tank analog frequency dividers for quadrature LO generation., , and . CICC, page 575-578. IEEE, (2005)Electron-assisted switching in FeFETs: Memory window dynamics - retention - trapping mechanisms and correlation., , , , , and . IRPS, page 4. IEEE, (2022)