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Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms.

, , и . DATE, стр. 658-663. European Design and Automation Association, Leuven, Belgium, (2006)

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Friedrich Taenzler

Jörg Taenzler

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Walter Taenzler

Bärbel Taenzler

 

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Optimized EVM Testing for IEEE 802.11a/n RF ICs., , , и . ITC, стр. 1-10. IEEE Computer Society, (2008)Online RF checkers for diagnosing multi-gigahertz automatic test boards on low cost ATE platforms., , и . DATE, стр. 658-663. European Design and Automation Association, Leuven, Belgium, (2006)Alternate Loop-Back Diagnostic Tests for Wafer-Level Diagnosis of Modern Wireless Transceivers using Spectral Signatures., , и . VTS, стр. 222-227. IEEE Computer Society, (2006)Physics Based Fault Models for Testing High-Voltage LDMOS., , , , , и . VLSI Design, стр. 285-290. IEEE Computer Society, (2013)A novel BIST technique for LDMOS drivers., , , и . MWSCAS, стр. 1069-1072. IEEE, (2014)Contactless characterization of microwave integrated circuits by device internal indirect electro-optic probing., , и . VTS, стр. 120-122. IEEE Computer Society, (1993)Development and empirical verification of an accuracy model for the power down leakage tests., , , и . VTS, стр. 1-6. IEEE Computer Society, (2014)Low cost test and tuning of RF circuits and systems., и . VTS, стр. 42. IEEE Computer Society, (2010)Production Test of High Volume Commercial RFIC.. ATS, стр. 476. IEEE, (2007)Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms., , и . ITC, стр. 1-9. IEEE Computer Society, (2008)