( en | de | ru )

 

Disambiguation of "Bernardi, Paolo"

Author of the publication

copydeleteadd this publication to your clipboard
Evaluating Alpha-induced soft errors in embedded microprocessors.

, , , , , , and . IOLTS, page 69-74. IEEE Computer Society, (2009)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Markus Bernardi

Giordano Paolo

Andreas Bernardi

Mirko Bernardi

Mariangela Bernardi

 

Other publications of authors with the same name

Test Considerations about the Structured ASIC Paradigm., and . DDECS, page 232-233. IEEE Computer Society, (2006)Accelerated Analysis of Simulation Dumps through Parallelization on Multicore Architectures., , , , , , , and . DDECS, page 69-74. IEEE, (2021)A novel SEU injection setup for Automotive SoC., , , , , , , and . ISIE, page 623-626. IEEE, (2022)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level., , , , , , , and . DFT, page 1-6. IEEE, (2022)A guided debugger-based fault injection methodology for assessing functional test programs., , , , , and . VTS, page 1-7. IEEE, (2023)Scan-chain intra-cell defects grading., , , , , , and . DTIS, page 1-6. IEEE, (2015)SW-based transparent in-field memory testing., , , and . LATS, page 1-6. IEEE Computer Society, (2015)On the in-field testing of spare modules in automotive microprocessors., , , , , and . VLSI-SoC, page 1-6. IEEE, (2017)On the in-field test of embedded memories., , , and . IOLTS, page 67-70. IEEE, (2017)