( en | de | ru )

 

Disambiguation of "Dilillo, Luigi"

Author of the publication

copydeleteadd this publication to your clipboard
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.

, , , , and . DDECS, page 256-261. IEEE Computer Society, (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Luigi Sportelli

Luigi Nardi

Luigi Busarello

Luigi Monni

Luigi Poisson

 

Other publications of authors with the same name

Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Evaluation of the temperature influence on SEU vulnerability of DICE and 6T-SRAM cells., , , and . DTIS, page 1-5. IEEE, (2018)Efficient March Test Procedure for Dynamic Read Destructive Fault Detection in SRAM Memories., , , , , and . J. Electron. Test., 21 (5): 551-561 (2005)Emulating the Effects of Radiation-Induced Soft-Errors for the Reliability Assessment of Neural Networks., , , , , , , and . IEEE Trans. Emerg. Top. Comput., 10 (4): 1867-1882 (2022)A Survey on Deep Learning Resilience Assessment Methodologies., , , , , and . Computer, 56 (2): 57-66 (February 2023)A calculation method to estimate single event upset cross section., , , , , and . Microelectron. Reliab., (2017)A study of path delay variations in the presence of uncorrelated power and ground supply noise., , , , , and . DDECS, page 189-194. IEEE Computer Society, (2011)On using a SPICE-like TSTAC™ eFlash model for design and test., , , , , , , , and . DDECS, page 359-364. IEEE Computer Society, (2011)Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling., , , , , , and . DDECS, page 353-358. IEEE Computer Society, (2011)Resistive-Open Defects in Embedded-SRAM Core Cells: Analysis and March Test Solution., , , , , and . Asian Test Symposium, page 266-271. IEEE Computer Society, (2004)