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March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.

L. Dilillo, P. Girard, S. Pravossoudovitch, A. Virazel, and M. Bastian. DDECS, page 256-261. IEEE Computer Society, (2006)

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Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.J. Ma, M. Tehranipoor, and P. Girard. J. Electron. Test., 28 (2): 201-214 (2012)An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs.P. Girard, O. Héron, S. Pravossoudovitch, and M. Renovell. J. Electron. Test., 22 (2): 161-172 (2006)An advanced diagnostic method for delay faults in combinational faulty circuits.P. Girard, C. Landrault, and S. Pravossoudovitch. J. Electron. Test., 6 (3): 277-294 (1995)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)

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Disambiguation of "Girard, Patrick"

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March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.

Please choose a person to relate this publication to

Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.

Please choose a person to relate this publication to

Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit.