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Disambiguation of "Cheng, Kwang-Ting"

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Enhancing test efficiency for delay fault testing using multiple-clocked schemes.

, , , , , , and . DAC, page 371-374. ACM, (2002)

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M Tingart

Wen-tsi Ting

Dieter Tingelhoff

Hans Ting

Karl Tingwaldt

 

Other publications of authors with the same name

Test Point Insertion: Scan Paths through Combinational Logic., , , and . DAC, page 268-273. ACM Press, (1996)A Hybrid Algorithm for Test Point Selection for Scan-Based BIST., , , and . DAC, page 478-483. ACM Press, (1997)Joint Segment-Level and Pixel-Wise Losses for Deep Learning Based Retinal Vessel Segmentation., , and . IEEE Trans. Biomed. Eng., 65 (9): 1912-1923 (2018)AQUILA: An equivalence verifier for large sequential circuits., , and . ASP-DAC, page 455-460. IEEE, (1997)Semi-supervised mp-MRI Data Synthesis with StitchLayer and Auxiliary Distance Maximization., , , and . CoRR, (2018)A portable multi-pitch e-drum based on printed flexible pressure sensors., , , , and . DATE, page 1082-1087. IEEE Computer Society, (2010)Enhancing test efficiency for delay fault testing using multiple-clocked schemes., , , , , , and . DAC, page 371-374. ACM, (2002)A Partial Enhanced-Scan Approach to Robust Delay-Fault Test Generation for Sequential Circuits., , and . ITC, page 403-410. IEEE Computer Society, (1991)Efficient test-point selection for scan-based BIST., , , and . IEEE Trans. Very Large Scale Integr. Syst., 6 (4): 667-676 (1998)Compact Test Generation With an Influence Input Measure for Launch-On-Capture Transition Fault Testing., , , and . IEEE Trans. Very Large Scale Integr. Syst., 22 (9): 1968-1979 (2014)