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Другие публикации лиц с тем же именем

Getting More out of ITC.. IEEE Des. Test Comput., 23 (5): 432 (2006)Deformations of IC Structure in Test and Yield Learning., , , , , и . ITC, стр. 856-865. IEEE Computer Society, (2003)Using well/substrate bias manipulation to enhance voltage-test-based defect detection., и . ITC, стр. 1-6. IEEE Computer Society, (2011)Detecting delay faults using power supply transient signal analysis., , , , и . ITC, стр. 395-404. IEEE Computer Society, (2001)Power Supply Transient Signal Analysis Under Real Process and Test Hardware Models., , и . VTS, стр. 357-366. IEEE Computer Society, (2002)IC failure mechanisms yesterday, today, tomorrow: implications from test to DFM.. ISPD, стр. 47. ACM, (2006)To DFT or Not to DFT?, , , , и . ITC, стр. 557-566. IEEE Computer Society, (1997)Test structures for delay variability., , , , , , и . Timing Issues in the Specification and Synthesis of Digital Systems, стр. 109. ACM, (2002)Static timing analysis based circuit-limited-yield estimation., , , и . ISCAS (5), стр. 81-84. IEEE, (2002)SimplerVoice: A Key Message & Visual Description Generator System for Illiteracy., , , , и . CoRR, (2018)