%0 Journal Article %1 journals/mr/RodriguezSLKCJNBBL02 %A Rodríguez, Rosana %A Stathis, James H. %A Linder, Barry P. %A Kowalczyk, Steven P. %A Chuang, Ching-Te %A Joshi, Rajiv V. %A Northrop, Gregory A. %A Bernstein, Kerry %A Bhavnagarwala, Azeez J. %A Lombardo, Salvatore %D 2002 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1445-1448 %T Analysis of the effect of the gate oxide breakdown on SRAM stability. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#RodriguezSLKCJNBBL02 %V 42

@article{journals/mr/RodriguezSLKCJNBBL02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Rodríguez, Rosana and Stathis, James H. and Linder, Barry P. and Kowalczyk, Steven P. and Chuang, Ching-Te and Joshi, Rajiv V. and Northrop, Gregory A. and Bernstein, Kerry and Bhavnagarwala, Azeez J. and Lombardo, Salvatore}, biburl = {https://www.bibsonomy.org/bibtex/2501b9f8f3c9452af607db72b2844951e/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00166-X}, interhash = {ad3511e1f9c1131563baf0d259361909}, intrahash = {501b9f8f3c9452af607db72b2844951e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1445-1448}, timestamp = {2020-02-25T13:30:02.000+0100}, title = {Analysis of the effect of the gate oxide breakdown on SRAM stability.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#RodriguezSLKCJNBBL02}, volume = 42, year = 2002 }