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Designing a Public Smart Registry for an Innovative and Transparent Governance of European Ground Infrastructures., , and . IDT/IIMSS/STET, volume 262 of Frontiers in Artificial Intelligence and Applications, page 758-767. IOS Press, (2014)Reliability of ultra-thin oxides in CMOS circuits., , , and . Microelectron. Reliab., 43 (9-11): 1353-1360 (2003)A novel approach to characterization of progressive breakdown in high-k/metal gate stacks., , , , , , , , and . Microelectron. Reliab., 48 (11-12): 1759-1764 (2008)Performance increase of tandem amorphous/microcrystalline Si PV devices under variable illumination and temperature conditions., , , , , and . Microelectron. Reliab., (2018)Dependence of Post-Breakdown Conduction on Gate Oxide Thickness., , and . Microelectron. Reliab., 42 (9-11): 1481-1484 (2002)Silicon photomultipliers with embedded optical filters for wearable healthcare applications., , , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2017)Detection and Classification of Single-Electron Jumps in Si Nanocrystal Memories., , , and . IEEE Trans. Instrumentation and Measurement, 57 (2): 364-368 (2008)Influence of gate oxides with high thermal conductivity on the failure distribution of InGaAs-based MOS stacks., , and . Microelectron. Reliab., (2016)Flexible CW-fNIRS system based on Silicon Photomultipliers: In-vivo characterization of sensorimotor response., , , , , , , and . IEEE SENSORS, page 1-3. IEEE, (2017)Structure of the oxide damage under progressive breakdown., , , , , and . Microelectron. Reliab., 45 (5-6): 845-848 (2005)