%0 Conference Paper %1 conf/irps/PutchaBFWZPZAKW20 %A Putcha, Vamsi %A Bury, Erik %A Franco, Jacopo %A Walke, Amey %A Zhao, Simeng %A Peralagu, Uthayasankaran %A Zhao, Ming %A Alian, AliReza %A Kaczer, Ben %A Waldron, Niamh %A Linten, Dimitri %A Parvais, Bertrand %A Collaert, Nadine %B IRPS %D 2020 %I IEEE %K dblp %P 1-8 %T Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#PutchaBFWZPZAKW20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/PutchaBFWZPZAKW20, added-at = {2023-09-30T00:00:00.000+0200}, author = {Putcha, Vamsi and Bury, Erik and Franco, Jacopo and Walke, Amey and Zhao, Simeng and Peralagu, Uthayasankaran and Zhao, Ming and Alian, AliReza and Kaczer, Ben and Waldron, Niamh and Linten, Dimitri and Parvais, Bertrand and Collaert, Nadine}, biburl = {https://www.bibsonomy.org/bibtex/232a0ca6ed9f429f7879e7e17d5d47b1a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9129251}, interhash = {bb1f349d0aa50a73b06eb63396599fdd}, intrahash = {32a0ca6ed9f429f7879e7e17d5d47b1a}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-8}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#PutchaBFWZPZAKW20}, year = 2020 }