( en | de | ru )

 

Disambiguation of "Franco, Jacopo"

Author of the publication

copydeleteadd this publication to your clipboard
Exploring the DC reliability metrics for scaled GaN-on-Si devices targeted for RF/5G applications.

, , , , , , , , , , , , and . IRPS, page 1-8. IEEE, (2020)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Jacopo Grazzini

Jacopo Janner

Jacopo Negroni

Jacopo Mauro

Jacopo Ghiglieri

 

Other publications of authors with the same name

Superior reliability and reduced Time-Dependent variability in high-mobility SiGe channel pMOSFETs for VLSI logic applications., , , , , , , , , and 6 other author(s). ICICDT, page 1-4. IEEE, (2012)Characterization of time-dependent variability using 32k transistor arrays in an advanced HK/MG technology., , , , , , , , , and . IRPS, page 3. IEEE, (2015)Accelerated Capture and Emission (ACE) Measurement Pattern for Efficient BTI Characterization and Modeling., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling., , , , , , , , and . ISCAS, page 2249-2252. IEEE, (2011)Understanding the Basic Advantages of Bulk FinFETs for Sub- and Near-Threshold Logic Circuits From Device Measurements., , , , , , and . IEEE Trans. Circuits Syst. II Express Briefs, 59-II (7): 439-442 (2012)BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic., , , , , , and . Microelectron. Reliab., 52 (9-10): 1932-1935 (2012)Molybdenum Nitride as a Scalable and Thermally Stable pWFM for CFET., , , , , , , , , and 11 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)The properties, effect and extraction of localized defect profiles from degraded FET characteristics., , , , , , , , , and 1 other author(s). IRPS, page 1-7. IEEE, (2021)A BSIM-Based Predictive Hot-Carrier Aging Compact Model., , , , , , , , , and . IRPS, page 1-9. IEEE, (2021)Degradation mechanisms and lifetime assessment of Ge Vertical PIN photodetectors., , , , , , , and . OFC, page 1-3. IEEE, (2022)