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Impact of Temperature on Reliability of MFIS HZO-based Ferroelectric Tunnel Junctions., , , , , , , , , and 5 other author(s). IRPS, page 11-1. IEEE, (2022)Improved Tunability of BEoL-integrated Hafnium Zirconium Oxide Varactors for mmWave Applications., , , , , and . DRC, page 1-2. IEEE, (2024)Study of Nanosecond Laser Annealing on Silicon Doped Hafnium Oxide Film Crystallization and Capacitor Reliability., , , , , , , , , and 7 other author(s). IMW, page 1-4. IEEE, (2022)Enhanced reliability and trapping behavior in ferroelectric FETs under cryogenic conditions., , , , , , , , , and 4 other author(s). IMW, page 1-4. IEEE, (2024)Hafnium oxide-based Ferroelectric Memories: Are we ready for Application?, , , , , , , , , and . IMW, page 1-4. IEEE, (2023)Ferroelectric HfO2/ZrO2 Superlattices with Improved Leakage at Bias and Temperature Stress., , , , , and . IMW, page 1-4. IEEE, (2023)Improved Endurance Reliability of Ferroelectric Hafnium Oxide-Based BEoL Integrated MFM Capacitors., , , , , , , , , and . IRPS, page 1-5. IEEE, (2024)