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Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation., , , and . DTIS, page 1-6. IEEE, (2015)Stress-Aware Periodic Test of Interconnects., , and . J. Electron. Test., 37 (5): 715-728 (2021)Near-Optimal Node Selection Procedure for Aging Monitor Placement., , and . IOLTS, page 6-11. IEEE, (2018)An off-line MDSI interconnect BIST incorporated in BS 1149.1., , , and . ETS, page 1-2. IEEE, (2014)BS 1149.1 extensions for an online interconnect fault detection and recovery., , , and . ITC, page 1-9. IEEE Computer Society, (2012)Universal mitigation of NBTI-induced aging by design randomization., , , and . EWDTS, page 1-5. IEEE Computer Society, (2016)Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study., , , and . DFT, page 1-6. IEEE, (2020)Virtual tester development using HDL/PLI., , , and . EWDTS, page 412-415. IEEE Computer Society, (2010)Self-Adjusting Monitor for Measuring Aging Rate and Advancement., , and . IEEE Trans. Emerg. Top. Comput., 8 (3): 627-641 (2020)Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication., , and . DSN-W, page 203-206. IEEE, (2023)