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Disambiguation of "Mak, T. M."

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A Comprehensive BIST Solution for Polar Transceivers Using On-Chip Resources.

, , , , , and . ACM Trans. Design Autom. Electr. Syst., 23 (1): 2:1-2:21 (2017)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ellen Mak

M t cet a

Philippe Denis Makowski

From supported palladium to metal free catalysts: different approaches in heterogeneous catalysis. Uni Potsdam, (2009)

Rebecca Mak

Kwok Mak

 

Other publications of authors with the same name

Soft Error Resilient System Design through Error Correction., , , , and . VLSI-SoC (Selected Papers), volume 249 of IFIP, page 143-156. Springer, (2006)Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors., , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (12): 2322-2325 (2011)Sequential Element Design With Built-In Soft Error Resilience., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 14 (12): 1368-1378 (2006)Clock Faults Induced Min and Max Delay Violations., , , , and . J. Electron. Test., 30 (1): 111-123 (2014)Invited Talk 1: Testing of Power Constraint Computing.. ATS, page 6. IEEE, (2007)Cache RAM inductive fault analysis with fab defect modeling., , , , , , and . ITC, page 862-871. IEEE Computer Society, (1998)Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint., , , and . ICCAD, page 191-196. ACM, (2009)An industrial case study for X-canceling MISR., , , and . ITC, page 1-10. IEEE Computer Society, (2009)Can Clock Faults be Detected Through Functional Test?, , , , and . DDECS, page 168-173. IEEE Computer Society, (2006)Clock Calibration Faults and their Impact on Quality of High Performance Microprocessors., , and . DFT, page 63-70. IEEE Computer Society, (2003)